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1

A Framework for Sustaining Innovation at Baker Library, Harvard Business School

Dolan, Meghan, Hemment, Michael, Oliver, Stephanie

Journal:

New Review of Academic Librarianship

Year:

2017

Language:

english

File:

PDF, 1.23 MB

english, 2017

2

Experiential AI

Hemment, Drew, Aylett, Ruth, Belle, Vaishak, Murray-Rust, Dave, Luger, Ewa, Hillston, Jane, Rovatsos, Michael, Broz, Frank

Journal:

Year:

2019

Language:

english

File:

PDF, 1.54 MB

english, 2019

3

Creative Assemblages: Organisation and Outputs of Practice-Led Research

Wilkie, Alex, Gaver, William, Hemment, Drew, Giannachi, Gabriella

Journal:

Year:

2010

Language:

english

File:

PDF, 508 KB

english, 2010

4

Characterisation of emitter/base leakage currents in SiGe HBTs produced using selective epitaxy

A.C Lamb, J.F.W Schiz, J.M Bonar, F Cristiano, P Ashburn, S Hall, P.L.F Hemment

Journal:

Microelectronics Reliability

Year:

2001

Language:

english

File:

PDF, 459 KB

english, 2001

5

Structure and composition of native oxides on GaAs

B.J. Sealy, P.L.F. Hemment

Journal:

Thin Solid Films

Year:

1974

Language:

english

File:

PDF, 244 KB

english, 1974

6

Soviet-Style Neoliberalism?

Journal:

Problems of Post-Communism

Year:

2009

Language:

english

File:

PDF, 2.46 MB

english, 2009

7

Book Reviews : The Changing Faces of Russian Women's Studies: Rosalind Marsh (ed.) Women in Russia and Ukraine Cambridge: Cambridge University Press, 1996, vii + 350 pp., ISBN 0-521-49872-4 Sue Bridger, Rebecca Kay and Kathryn Pinnick No More Heroines? Russia, Women and the Market London and NewYork: Routledge, 1996, v + 220 pp., ISBN 0-415-12460-3 Hilary Pilkington (ed.) Gender, Generation and Identity in Contemporary Russia London and New York: Routledge, 1996, vii + 306 pp., ISBN 0-415-13544-3 Mary Buckley (ed.) Post-Soviet Women: From the Baltic to Central Asia Cambridge: Cambridge University Press, 1997, vii + 316 pp., ISBN 0-521-56530-8

Uspenskaya, V., Hemment, J.

Journal:

European Journal of Women's Studies

Year:

1998

Language:

english

File:

PDF, 376 KB

english, 1998

8

The effects of different implantation and annealing temperatures on the structural and chemical properties of high dose oxygen-ion-implanted silicon

C.G. Tuppen, M.R. Taylor, P.L.F. Hemment, R.P. Arrowsmith

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 2.36 MB

english, 1985

9

Precipitation of oxygen in single-crystal silicon implanted with high doses of oxygen

P.L.F. Hemment, E.A. Maydell-Ondrusz, J.E. Castle, R. Paynter, M.C. Wilson, R.G. Booker, J.A. Kilner, R.P. Arrowsmith

Journal:

Thin Solid Films

Year:

1985

Language:

english

File:

PDF, 549 KB

english, 1985

10

Processing of titanium films on silicon using a Q-switched ruby laser

E. Maydell-Ondrusz, P.L.F. Hemment, K.G. Stephens

Journal:

Thin Solid Films

Year:

1986

Language:

english

File:

PDF, 432 KB

english, 1986

11

Depth profiles of the optical properties of buried oxides (SIMOX) by ellipsometry

M. Levy, E. Scheid, S. Cristoloveanu, P. Hemment

Journal:

Thin Solid Films

Year:

1987

Language:

english

File:

PDF, 428 KB

english, 1987

12

Modelling of 18O tracer studies of the oxygen redistribution during formation of SiO2 layers by high dose implantation

H.U. Jager, J.A. Kilner, R.J. Chater, P.L.F. Hemment, R.F. Peart, K.J. Reeson

Journal:

Thin Solid Films

Year:

1988

Language:

english

File:

PDF, 504 KB

english, 1988

13

Mechanism of buried β-SiC formation by implanted carbon in silicon

K.J. Reeson, J. Stoemenos, P.L.F. Hemment

Journal:

Thin Solid Films

Year:

1990

Language:

english

File:

PDF, 2.89 MB

english, 1990

14

A comparison of the behaviour of Si0.5Ge0.5 alloy during dry and wet oxidation

J.P. Zhang, P.L.F. Hemment, S.M. Newstead, A.R. Powell, T.E. Whall, E.H.C. Parker

Journal:

Thin Solid Films

Year:

1992

Language:

english

File:

PDF, 352 KB

english, 1992

15

Characterization of GaAs thin films grown by molecular beam epitaxy on Si-on-insulator

Zhu Wenhua, Lin Chenglu, Yu Yuehui, Li Aizhen, Zou Shichang, PLF Hemment

Journal:

Year:

1991

Language:

english

File:

PDF, 117 KB

english, 1991

16

Suppression of boron transient enhanced diffusion in silicon and silicon germanium by fluorine implantation

H.A.W. El Mubarek, Y. Wang, R. Price, J.M. Bonar, J. Zhang, P.L.F. Hemment, P. Ashburn

Journal:

Materials Science in Semiconductor Processing

Year:

2005

Language:

english

File:

PDF, 474 KB

english, 2005

17

Silicon on insulator optical waveguides formed by direct wafer bonding

G.T. Reed, Li Jinhua, C.K. Tang, Lin Chenglu, P.L.F. Hemment, A.G. Rickman

Journal:

Materials Science and Engineering: B

Year:

1992

Language:

english

File:

PDF, 373 KB

english, 1992

18

Raised source/drains for 50 nm MOSFETs using a silane/dichlorosilane mixture for selective epitaxy

A.M. Waite, N.S. Lloyd, K. Osman, W. Zhang, T. Ernst, H. Achard, Y. Wang, S. Deleonibus, P.L.F. Hemment, D.M. Bagnall, A.G.R. Evans, P. Ashburn

Journal:

Solid-State Electronics

Year:

2005

Language:

english

File:

PDF, 330 KB

english, 2005

19

An effect of poor vacuum conditions on the analysis of thin films by Rutherford backscattering

P.L.F. Hemment, J.F. Singleton, K.G. Stephens

Journal:

Thin Solid Films

Year:

1975

Language:

english

File:

PDF, 202 KB

english, 1975

20

Effect of fluorine implantation dose on boron transient enhanced diffusion and boron thermal diffusion in Si1-xGex

Mubarek, H.A.W.E., Karunaratne, M., Bonar, J.M., Dilliway, G.D., Wang, Y., Hemment, P.L.F., Willoughby, A.F., Ashburn, P.

Journal:

IEEE Transactions on Electron Devices

Year:

2005

Language:

english

File:

PDF, 1.17 MB

english, 2005

21

The Riddle of the Third Sector: Civil Society, International Aid, and NGOs in Russia

Journal:

Anthropological Quarterly

Year:

2004

Language:

english

File:

PDF, 2.58 MB

english, 2004

22

Pacific Rim New Media Summit Companion || Locative Arts

Journal:

Year:

2006

Language:

english

File:

PDF, 2.39 MB

english, 2006

23

[IEEE ESSDERC 2003. 33rd European Solid-State Device Research - ESSDERC '03 - Estoril, Portugal (16-18 Sept. 2003)] Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) - Raised source/drain (RSD) for 50nm MOSFETs - effect of epitaxy layer thickness on short channel effects

Waite, A.M., Lloyd, N.S., Ashburn, P., Evans, A.G.R., Ernst, T., Achard, H., Deleonibus, S., Wang, Y., Hemment, P.

Year:

2003

Language:

english

File:

PDF, 273 KB

english, 2003

24

Effect of fluorine implantation dose on boron thermal diffusion in silicon

El Mubarek, H. A. W., Bonar, J. M, Dilliway, G. D., Ashburn, P., Karunaratne, M., Willoughby, A. F., Wang, Y., Hemment, P. L. F., Price, R., Zhang, J., Ward, P.

Journal:

Journal of Applied Physics

Year:

2004

Language:

english

File:

PDF, 429 KB

english, 2004

25

Investigation of Trapping Properities in Simox Films by Photo-Induced Current Transient Spectroscopy

Papaioannou, G., Ioannou-Sougleridis, V., Cristoloveanu, S., Bruel, M., Hemment, P.L.F.

Journal:

Materials Science Forum

Year:

1989

File:

PDF, 287 KB

1989

26

Dose Dependence of Defects in Silicon Produced by High Dose, High Temperature O+ Implantation

Hobbs, A., Barklie, R.C., Reeson, K.J., Hemment, P.L.F.

Journal:

Materials Science Forum

Year:

1986

File:

PDF, 283 KB

1986

27

The Riddle of the Third Sector: Civil Society, International Aid, and NGOs in Russia

Journal:

Anthropological Quarterly

Year:

2004

Language:

english

File:

PDF, 659 KB

english, 2004

28

Red Scares and Orange Mobilizations: A Critical Anthropological Perspective on the Russian Hacking Scandal

Journal:

Year:

2017

Language:

english

File:

PDF, 609 KB

english, 2017

29

Nashi, Youth Voluntarism, and Potemkin NGOs: Making Sense of Civil Society in Post-Soviet Russia

Journal:

Year:

2012

Language:

english

File:

PDF, 2.09 MB

english, 2012

30

Ge+ ion implantation — a competing technology?

P.L.F. Hemment, F. Cristiano, A. Nejim, S. Lombardo, K.K. Larssen, F. Priolo, R.C. Barklie

Journal:

Journal of Crystal Growth

Year:

1995

Language:

english

File:

PDF, 1.01 MB

english, 1995

31

Rutherford backscatter technique as applied to thin (transparent) specimens

P.L.F. Hemment, A.W. Tinsley

Journal:

Nuclear Instruments and Methods

Year:

1971

Language:

english

File:

PDF, 84 KB

english, 1971

32

Defect introduction rates and defect identification studies in low-energy electron irradiated silicon

P.L.F. Hemment, P.R.C. Stevens

Journal:

Nuclear Instruments and Methods

Year:

1971

Language:

english

File:

PDF, 452 KB

english, 1971

33

Carrier compensation in O+ implanted n-type GaAs

T. Asano, P.L.F. Hemment

Journal:

Solid-State Electronics

Year:

1980

Language:

english

File:

PDF, 136 KB

english, 1980

34

Effects of electric field on photoconductive frequency resolved spectroscopy: Analysis of silicon-on-insulator structures

F. Coromina, A. Pérez-Rodríguez, J.R. Morante, J. Macía, M.A. Lourenço, K.P. Homewood, P.L.F. Hemment

Journal:

Solid-State Electronics

Year:

1992

Language:

english

File:

PDF, 473 KB

english, 1992

35

Oxygen distributions in synthesized SiO2 layers formed by high dose O+ implantation into silicon

PLF Hemment, E Maydell-Ondrusz, KG Stevens, JA Kilner, J Butcher

Journal:

Year:

1984

Language:

english

File:

PDF, 579 KB

english, 1984

36

Silicon on insulator structures formed by ion implantation

Journal:

Year:

1985

Language:

english

File:

PDF, 143 KB

english, 1985

37

Ion beam synthesis of thin buried layers of SiO2 in silicon

PLF Hemment, KJ Reeson, JA Kilner, RJ Chater, C Marsh, GR Booker, GK Celler, J Stoemenos

Journal:

Year:

1986

Language:

english

File:

PDF, 590 KB

english, 1986

38

Formation mechanism and structures of buried oxy-nitride layers produced by ion beam synthesis

KJ Reeson, PLF Hemment, JA Kilner, RJ Chater, CD Meekison, C Marsch, GR Booker, JR Davis

Journal:

Year:

1986

Language:

english

File:

PDF, 453 KB

english, 1986

39

Microstructure of silicon-on-insulator structures produced by high dose nitrogen implantation of silicon

CD Meekison, GR Booker, KJ Reeson, PLF Hemment, RJ Chater, JA Kilner, JR Davis

Journal:

Year:

1986

Language:

english

File:

PDF, 559 KB

english, 1986

40

Preface

JA Kilner, KJ Reeson, PLF Hemment

Journal:

Year:

1991

Language:

english

File:

PDF, 81 KB

english, 1991

41

Simox bibliography

PLF Hemment, KJ Reeson, JA Kilner, SJ Krause

Journal:

Year:

1991

Language:

english

File:

PDF, 4.03 MB

english, 1991

42

Delineation of defects in SIMOX structures using a chemical etching technique

L F Giles, A Nejim, P L F Hemment, T W Fan

Journal:

Year:

1992

Language:

english

File:

PDF, 368 KB

english, 1992

43

Formation of buried insulating layers in silicon by the implantation of high doses of oxygen

P.L.F. Hemment, E. Maydell-Ondrusz, K.G. Stephens, J. Butcher, D. Ioannou, J. Alderman

Journal:

Nuclear Instruments and Methods in Physics Research

Year:

1983

Language:

english

File:

PDF, 534 KB

english, 1983

44

Ion beam dosimetry by Rutherford backscattering with continuous rotation of the sample

P.L.F. Hemment, E.A. Maydell-Ondrusz, K.G. Stephens

Journal:

Nuclear Instruments and Methods in Physics Research

Year:

1983

Language:

english

File:

PDF, 306 KB

english, 1983

45

SIMS analysis of silicon on insulator structures formed by high-dose O+ implantation into silicon

J.A. Kilner, S.D. Littlewood, P.L.F. Hemment, E. Maydell-Ondrusz, K.G. Stephens

Journal:

Nuclear Instruments and Methods in Physics Research

Year:

1983

Language:

english

File:

PDF, 372 KB

english, 1983

46

Electrical and optical characterisation of double SIMOX structures formed by sequential high energy oxygen implantation into silicon

N. Hatzopoulos, D. Panknin, W. Fukarek, W. Skorupa, D.I. Siapkas, P.L.F. Hemment

Journal:

Microelectronic Engineering

Year:

1995

Language:

english

File:

PDF, 353 KB

english, 1995

47

Optical and compositional studies of buried oxide layers in silicon formed by high dose implantation

R.J. Chater, J.A. Kilner, E. Scheid, S. Cristoloveneau, P.L.F. Hemment, K.J. Reeson

Journal:

Applied Surface Science

Year:

1987

Language:

english

File:

PDF, 353 KB

english, 1987

48

Defect production during the fabrication of SOI by oxygen ion implantation

R.C. Barklie, T.J. Ennis, K. Reeson, P.L.F. Hemment

Journal:

Applied Surface Science

Year:

1989

Language:

english

File:

PDF, 464 KB

english, 1989

49

Temperature dependence and non-uniformity of electrical properties of SOI films obtained by oxygen implantation

S. Cristoloveanu, J. Wyncoll, P. Spinelli, P.L.F. Hemment, R.P. Arrowsmith

Journal:

Year:

1985

Language:

english

File:

PDF, 299 KB

english, 1985

50

Lattice disorder investigation of SIMOX film by multi-crystal X-ray diffractometry

A.Yu. Nikulin, A.A. Snigirev, V.V. Starkov, P.L.E. Hemment, A.F. Vyatkin

Journal:

Materials Science and Engineering: B

Year:

1992

Language:

english

File:

PDF, 335 KB

english, 1992

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